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12 "IC probe table semiconductor wafer point measuring machine

    Suitable for 6 inch, 8 inch, 12 inch wafers, including SIC diode, transistor, mosfet, vertical structure chip measurement;

    Multi-pin design can realize the requirement of multi-pin measurement at the same time, and improve the testing capacity of the machine;

    With automatic needle cleaning, automatic needle grinding function;

    The machine is equipped with a 10x lens for needle alignment, which can detect whether the needle tip of the probe card is offset by regular scanning to ensure stable production.

    Built-in GPIB, RS232, TTL and other open interfaces, can be used with various chip testers in the market;

    The chuck surface is gold-plated (can be nickel-plated) and is compatible with 6, 8, and 12-inch wafer vacuums

  • Parameters

    Suitable for 6 inch, 8 inch, 12 inch wafers, including SIC diode, transistor, mosfet, vertical structure chip measurement;

    Multi-pin design can realize the requirement of multi-pin measurement at the same time, and improve the testing capacity of the machine;

    With automatic needle cleaning, automatic needle grinding function;

    The machine is equipped with a 10x lens for needle alignment, which can detect whether the needle tip of the probe card is offset by regular scanning to ensure stable production.

    Built-in GPIB, RS232, TTL and other open interfaces, can be used with various chip testers in the market;

    The chuck surface is gold-plated (can be nickel-plated) and is compatible with 6, 8, and 12-inch wafer vacuums

12 "IC probe table semiconductor wafer point measuring machine
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12 "IC probe table semiconductor wafer point measuring machine

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INQUIRY

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Address:3rd Floor, Building B, No. 84 Xinyu Road, Xinqiao Street, Bao'an District, Shenzhen City, Guangdong Province

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